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Orbis PC Micro - XRF Analyzer


The Orbis PC Micro-XRF Analyzer is an upgraded
model that is exceptionally well suited to analyze
smaller samples or make faster measurements.
The instrument is delivered with an advanced,
LN-Free X-ray silicon drift detector (SDD), enhanced
color video camera with 3x digital zoom, and a 30 µm
polycapillary lens. The Orbis PC’s sample positioner has
an upgraded XYZ stage with higher-precision sample

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Standard Orbis PC components include:
- Rh tube (50 kV, 50 W)
- 30 µm ultra-high intensity poly-capillary
optic (FWHM @ MoKα)
- Automated primary beam filter system
(Open position, 6 filters, Shutter)
- Dual CCD cameras: 10x color; 75x color
(3x digital zoom) - Advanced 30 mm2 Silicon Drift Detector (SDD).
No liquid cryogen cooling required
- High precision computer-controlled XYZ stage
- Sample chamber: vacuum or air
- Digital signal analyzer electronics
- Operating SW with automated analysis and
quantification routines including: - Fundamental Parameter analysis with or
without standards
- Trace element analysis in light element
matrices using Fundamental Parameters
- Semi-empirical analysis using calibrations with standards

- Sample chamber viewport with 4.9" x 4.9"
(124 mm x 124 mm) viewable area
- Advanced 50 mm2 Silicon Drift Detector (SDD)
- Mo tube (50 kV, 50 W)
- Automated collimators (1 mm and 2 mm) in
conjunction with mono-capillary optic; selectable
by SW control
- Software: Spectral Mapping, Image Processing SW,
Linescan, Coating Analysis, Spectral Matching, Alloy ID,
Remote Spectrometer SW for data processing